HORIBA CombiScope AFM and inverted light microscopy

HORIBA

CombiScope

AFM and inverted light microscopy

Specifications:

Contact AFM in air;
Contact AFM in liquid (optional);
Semicontact AFM in air;
Semicontact AFM in liquid (optional);
True Non-contact AFM;
Dynamic Force Microscopy (DFM, FM-AFM);
Dissipation Force Microscopy;
Top Mode;
Phase Imaging;
Lateral Force Microscopy (LFM);
Force Modulation;
Conductive AFM (optional);
I-Top mode (optional);
Magnetic Force Microscopy (MFM);
Kelvin Probe (Surface Potential Microscopy);
Single-pass Kelvin Probe;
Capacitance Microscopy (SCM)
Electric Force Microscopy (EFM);
Single-pass MFM/EFM (“Plane scan”);
Force curve measurements;
Piezo Response Force Microscopy (PFM);
PFM-Top mode;
Nanolithography;
Nanomanipulation;
STM (optional);
Photocurrent Mapping (optional);
Volt-ampere characteristic measurements (optional).