HORIBA
LEM
Camera Endpoint Monitor based on Real Time Laser Interferometry
Specifications:
System outline | LEM camera consists of a compact interference measurement section that includes the laser source, light receiver, and optical components, as well as the illumination and CCD imaging camera, allowing monitoring of any area of the wafer surface using microscopic images. |
Light source | Laser diode |
Light source wavelengths | 670 nm, 905 nm, 980 nm |
Magnification | 50x (G50) or 120x (G120) |
Spot diameter | 20 μm to 100 μm, depending on camera to wafer distance |
Detector | Pin-photo diode |
Camera Dimensions | 65 (W) × 160 (H) × 100 (D) mm 2.6 (W) × 6.3 (H) × 3.9 (D) in (camera only, excluding stage) |
Camera mass | 1.2 kg, 2.6 lb |
Remote | LEM-CT only may be connected to any host through digital Link with RJ 45 connector: TCP/IP. An optional SEQ70 box contains an interface board to provide galvanic isolation between the host controller hardware of the HOST / Tool from the box main electronics Label on | Description | Plug type | Remote | PIO, RS, analog 0-5V | Female DB25 |
scrollable This permits to communicate by logic wiring, fast, deterministic with full optocouplers and power spikes isolation, frequently found in industrial fab environment |