Spectral coverage | With 532 nm laser:210 to 3500 cm–1 With 660 nm laser:400 to 3150 cm–1 With 785 nm laser:210 to 2700 cm–1 |
Numerical aperture | F/3.1 |
Stray light rejection Typical (Maximum) | 0.1% (0.2%) (measured with bandpass filter 780BP10) |
CCD Detector & Typical Q.E. | Back-illuminated CCD with low etaloning in NIR 55% peak QE at 850nm(VIS optimized) |
Detector height Fiber-optic option | 300μm CCD height standard (1000μm optional) 200 or 300μm dia.,1m long fiber optic (for 1mm tall CCD, RTS bundle is offered) |
Thermoelectric stabilization | None. Dark current and CCD-pattern noise must be subtracted. User must shutter in optical path. QE shifts slightly with temperature. |
Spectral resolution Pixel resolution Slit (factory configuration) | 785nm configuration;25μm slit; 2048 pixels; 8–12cm–1 resolution; 0.19nm/pixel (configuration with 300μm tall CCD) Available slits: 12-25-37-50-62-75-100-125-150-200μm (contact us for other gratings) |
Improved CCD full well Raw non linearity Factory corrected non linearity | >250Ke- (sensitivity mode) <1% (sensitivity mode) < 0.4% (sensitivity mode) |
Typical dynamic range | 7000:1 in sensitivity mode |
Readout speed | 8.6ms (500kHz mode); 116 spectra/s with 0 exposure time (Multi-Acq mode) Max: 4.5 ms (Ultra mode); 223 spectra/s with 0 exposure time (Multi-Acq mode) |