HORIBA SmartSPM Advanced stand-alone AFM

HORIBA

SmartSPM

Advanced stand-alone AFM

Specifications:

Measuring Modes

• Contact AFM in air;

• Contact AFM in liquid (optional);

• Semicontact AFM in air;

• Semicontact AFM in liquid (optional);

• True Non-contact AFM;

• Dynamic Force Microscopy (DFM, FM-AFM);

• Dissipation Force Microscopy;

• Top Mode;

• Phase Imaging;

• Lateral Force Microscopy (LFM);

• Force Modulation;

• Conductive AFM (optional);

• I-Top mode (optional);

• Magnetic Force Microscopy (MFM);

• Kelvin Probe (Surface Potential Microscopy);

• Single-pass Kelvin Probe;

• Capacitance Microscopy (SCM)

• Electric Force Microscopy (EFM);

• Single-pass MFM/EFM (“Plane scan”);

• Force curve measurements;

• Piezo Response Force Microscopy (PFM);

• PFM-Top mode;

• Nanolithography;

• Nanomanipulation;

• STM (optional);

• Photocurrent Mapping (optional);

• Volt-ampere characteristic measurements (optional);

• Shear-force Microscopy with tuning fork (ShFM);

• Normal Force Microscopy with tuning fork.