CCD Sensor Format | 2048 x 70 |
Quantum Efficiency at 25°C (See QE curve below for NIR Optimized) | 60% at 500 nm 80% at 600 nm 80% at 800 nm 68% at 900 nm 42% at 1000 nm 20% at 1075nm |
Pixel Size | 14μm x 14μm |
Image Area | 28.7mm x 0.98mm, 100% fill factor |
Deep Thermoelectric Cooling | –50°C @ +25°C ambient (–60°C @ +25°C ambient, on request) Yields low dark current suitable for most OEM and some Research applications |
Single Pixel Well Capacity | 50,000 e–/pixel (Minimum) 60,000 e–/pixel (Typical) |
Serial Register Full Well Capacity | 250,000e– (Minimum) 500,000 e–/pixel (Typical) (Typical Output Register Saturation) |
Scan Rates | 45 kHz and 500kHz |
Readout Noise (at 45 kHz and at –50 °C) *1 | 9 e– (Typical) to 12e– (Maximum) |
Readout Noise (at 500kHz and at –50 °C) *1 | 20 e– (Typical) to 25 e– (Maximum) |
Maximum Spectral Rate | 20 Hz at 45 kHz scan rate 189 Hz at 500kHz scan rate |
Digitization | 16 bit ADC |
Dynamic Range (Typical for Serial Register) *2 | 55,500:1 |
Non Linearity (Measured on Each Camera) | 0.15% (typical) at 45 kHz (0.4% maximum) 0.20% (typical) at 500 kHz (1% maximum) |
Dark Current at –50°C *3 (Note that pixel size = 14 μm) | 0.05 e–/pixel/sec (Typical) |
Software-Adjustable Gains | 2, 4 & 9.5 e–/count @ -50ºC |