HORIBA

HORIBA Transmission Raman Raman accessory for pharmaceuticals

HORIBATransmission RamanRaman accessory for pharmaceuticalsSpecifications:Basic modes:Contact AFMSemicontact AFMTrue Non-contact AFMTop Mode™Phase ImagingDissipation Force MicroscopyContact AFM in liq

  • model:

HORIBA

Transmission Raman

Raman accessory for pharmaceuticals


Specifications:

  • Basic modes:

    • Contact AFM

    • Semicontact AFM

    • True Non-contact AFM

    • Top Mode™

    • Phase Imaging

    • Dissipation Force Microscopy

    • Contact AFM in liquid (optional)

    • Semicontact AFM in liquid (optional)

  • Electrical modes:

    • Single / Double pass Kelvin Probe Force Microscopy (KPFM) AM and FM

    • Capacitance Microscopy (SCM)

    • Single / Double pass Electric Force Microscopy (EFM)

    • Piezo Response Force Microscopy (PFM)

    • PFM with High Voltage (optional)

    • PFM-Top mode™

    • Conductive AFM (optional)

    • Conductive AFM High Voltage (optional)

    • I-Top mode™ (optional)

    • I-V Spectroscopy (optional)

    • Photocurrent Mapping (optional)

    • Volt-ampere characteristic measurements (optional)

  • Nanomechanical modes:

    • Lateral Force Microscopy (LFM)

    • Force Modulation Microscopy (FMM)

    • Force Curve Measurement (Force Distance (F-D) Spectroscopy and Mapping)

    • Nanolithography

    • Nanomanipulation

  • Special modes:

    • Single / Double pass Magnetic Force Microscopy (MFM)

    • Tunable Magnetic Field (optional)

    • Shear-force Microscopy with tuning fork (ShFM)

    • Normal-force Microscopy with tuning fork (optional)

  • Others:

    • Scanning Tunneling Microscopy (STM) (optional)

    • Scanning Tunneling Spectroscopy (optional)


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