HORIBA
Transmission Raman
Raman accessory for pharmaceuticals
Specifications:
Basic modes:
Contact AFM
Semicontact AFM
True Non-contact AFM
Top Mode™
Phase Imaging
Dissipation Force Microscopy
Contact AFM in liquid (optional)
Semicontact AFM in liquid (optional)
Electrical modes:
Single / Double pass Kelvin Probe Force Microscopy (KPFM) AM and FM
Capacitance Microscopy (SCM)
Single / Double pass Electric Force Microscopy (EFM)
Piezo Response Force Microscopy (PFM)
PFM with High Voltage (optional)
PFM-Top mode™
Conductive AFM (optional)
Conductive AFM High Voltage (optional)
I-Top mode™ (optional)
I-V Spectroscopy (optional)
Photocurrent Mapping (optional)
Volt-ampere characteristic measurements (optional)
Nanomechanical modes:
Lateral Force Microscopy (LFM)
Force Modulation Microscopy (FMM)
Force Curve Measurement (Force Distance (F-D) Spectroscopy and Mapping)
Nanolithography
Nanomanipulation
Special modes:
Single / Double pass Magnetic Force Microscopy (MFM)
Tunable Magnetic Field (optional)
Shear-force Microscopy with tuning fork (ShFM)
Normal-force Microscopy with tuning fork (optional)