HORIBAXploRA NanoAFM-Raman for Physical and Chemical imagingSpecifications:SmartSPM Scanner and BaseSample scanning range: 100 µm x 100 µm x 15 µm (±10 %)Scanning type by sample: XY non-linearity 0.05
HORIBA
XploRA Nano
AFM-Raman for Physical and Chemical imaging
Specifications:
Sample scanning range: 100 µm x 100 µm x 15 µm (±10 %)
Scanning type by sample: XY non-linearity 0.05 %; Z non-linearity 0.05 %
Noise: 0.1 nm RMS in XY dimension in 200 Hz bandwidth with capacitance sensors on; 0.02 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors off; < 0.04 nm RMS Z capacitance sensor in 1000 Hz bandwidth
Resonance frequency: XY: 7 kHz (unloaded); Z: 15 kHz (unloaded)
X, Y, Z movement: Digital closed loop control for X, Y, Z axes; Motorized Z approach range 18 mm
Sample size: Maximum 40 x 50 mm, 15 mm thickness
Sample positioning: Motorized sample positioning range 5 x 5 mm
Positioning resolution: 1 µm
Laser wavelength: 1300 nm, non-interfering with spectroscopic detector
Alignment: Fully automated cantilever and photodiode alignment
Probe access: Free access to the probe for additional external manipulators and probes
Contact AFM in air/(liquid optional); Semicontact AFM in air/(liquid optional); Non -contact AFM; Phase imaging; Lateral Force Microscopy (LFM); Force Modulation; Conductive AFM (optional); Magnetic Force Microscopy (MFM); Kelvin Probe (Surface Potential Microscopy, SKM, KPFM); Capacitance and Electric Force Microscopy (EFM); Force curve measurement; Piezo Response Force Microscopy (PFM); Nanolithography; Nanomanipulation; STM (optional); Photocurrent Mapping (optional); Volt-ampere characteristic measurements (optional)
Confocal Raman, Fluorescence and Photoluminescence imaging and spectroscopy
Tip-Enhanced Raman Spectroscopy (TERS) in AFM, STM, and shear force modes
Tip-EnhancedPhotoluminescence (TEPL)
Near-field Optical Scanning Microscopy and Spectroscopy (NSOM/SNOM)
Current range: 100 fA ÷ 10 µA; 3 current ranges (1 nA, 100 nA and 10 µA) switchable from the software